Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches. - Augusto Tazzoli; Marco Barbato; F. Mattiuzzo; V. Ritrovato; Gaudenzio Meneghesso (Microelectron. Reliab., 2010)

Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test. - A. Massenz; Marco Barbato; Valentina Giliberto; Benno Margesin; S. Colpo; Gaudenzio Meneghesso (Microelectron. Reliab., 2011)

Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation. - Giorgio De Pasquale; Marco Barbato; Valentina Giliberto; Gaudenzio Meneghesso; Aurelio Somà (Microelectron. Reliab., 2012)

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. - Alessandro Compagnin; Matteo Meneghini; Marco Barbato; Valentina Giliberto; Andrea Cester; Massimo Vanzi; Giovanna Mura; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2013)

ESD characterization of multi-chip RGB LEDs. - Simone Vaccari; Matteo Meneghini; Alessio Griffoni; Diego Barbisan; Marco Barbato; S. Carraro; Marco La Grassa; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures. - Marco Barbato; Andrea Cester; Viviana Mulloni; Benno Margesin; Giorgio De Pasquale; Aurelio Somà; Gaudenzio Meneghesso (ESSDERC, 2014)

ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms. - Matteo Dal Lago; Matteo Meneghini; Carlo De Santi; Marco Barbato; Nicola Trivellin; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. - Matteo Meneghini; Simone Vaccari; Matteo Dal Lago; Stefano Marconi; Marco Barbato; Nicola Trivellin; Alessio Griffoni; Alberto Alfier; Giovanni Verzellesi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. - Marco Barbato; Matteo Meneghini; Andrea Cester; Alessandro Barbato; Enrico Zanoni; Gaudenzio Meneghesso; Giovanna Mura; Diego Tonini; A. Voltan; Giorgio Cellere (IRPS, 2015)

Effects of constant voltage and constant current stress in PCBM: P3HT solar cells. - Andrea Cester; Antonio Rizzo; A. Bazzega; Nicolò Lago; J. Favaro; Marco Barbato; Nicola Wrachien; Suren A. Gevorgyan; Michael Corazza; Frederik C. Krebs (Microelectron. Reliab., 2015)

Distributed learning of Random Weights Fuzzy Neural Networks. - Roberto Fierimonte; Marco Barbato; Antonello Rosato; Massimo Panella (FUZZ-IEEE, 2016)

Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level. - Isabella Rossetto; Matteo Meneghini; Eleonora Canato; Marco Barbato; Steve Stoffels; Niels Posthuma; Stefaan Decoutere; Andrea Natale Tallarico; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2017)

Long-term stresses on linear micromirrors for pico projector application. - M. Silvestrini; Marco Barbato; Sonia Costantini; L. Castoldi; Federico Vercesi; Luigi Zanotti; Gaudenzio Meneghesso (Microelectron. Reliab., 2017)

Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. - Marco Buonomo; Lorenzo Torto; Marco Barbato; Nicola Wrachien; Antonio Rizzo; Suren A. Gevorgyan; Frederik C. Krebs; Andrea Cester (Microelectron. Reliab., 2018)