Carrier trapping in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices. - Giuseppe Currò; Marco Camalleri; Denise Calì; Francesca Monforte; Fortunato Neri (Microelectron. Reliab., 2007)

Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices. - Giuseppe Currò; Marco Camalleri; Denise Calì; Francesca Monforte; Fortunato Neri (Microelectron. Reliab., 2007)

Nitrogen bonding configurations near the oxynitride/silicon interface after oxynitridation in N2O ambient of a thin SiO2 gate. - Francesca Monforte; Marco Camalleri; Denise Calì; Giuseppe Currò; Enza Fazio; Fortunato Neri (Microelectron. Reliab., 2007)