An aging-aware transistor sizing tool regarding BTI and HCD degradation modes. - Nico Hellwege; Nils Heidmann; Marco Erstling; Dagmar Peters-Drolshagen; Steffen Paul (MIXDES, 2015)

Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects. - Theodor Hillebrand; Timur Schafer; Nico Hellwege; Marco Erstling; Dagmar Peters-Drolshagen; Steffen Paul (PATMOS, 2016)

Reliability evaluation of tungsten donut-via as an element of the highly robust metallization. - Verena Hein; Marco Erstling; Raj Sekar Sethu; Kirsten Weide-Zaage; Tianlin Bai (Microelectron. Reliab., 2016)

Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects. - Timur Schafer; Theodor Hillebrand; Nico Hellwege; Marco Erstling; Dagmar Peters-Drolshagen; Steffen Paul (J. Low Power Electron., 2017)