Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources. - Mauro Ciappa; Marco Pocaterra (IRPS, 2020)

Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation. - Mauro Ciappa; Marco Pocaterra (IRPS, 2021)