Tunnel oxide degradation under pulsed stress. - G. Ghidini; C. Capolupo; G. Giusto; A. Sebastiani; B. Stragliati; Maria Elena Vitali (Microelectron. Reliab., 2005)

In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability. - M. Langenbuch; R. Bottini; Maria Elena Vitali; G. Ghidini (Microelectron. Reliab., 2005)