FPGA SEE Test with Ultra-High Energy Heavy Ions. - Gianluca Furano; Antonis Tavoularis; Lucana Santos; Veronique Ferlet-Cavrois; Cesar Boatella; Ruben Garcia Alia; Pablo Fernández-Martínez; Maria Kastriotou; Vanessa Wyrwoll; Salvatore Danzeca; Maris Tali; Dejan Gacnik; et al. (DFT, 2018)

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study. - Lucas Matana Luza; Daniel Söderström; André Martins Pio de Mattos; Eduardo Augusto Bezerra; Carlo Cazzaniga; Maria Kastriotou; Christian Poivey; Luigi Dilillo (DTIS, 2021)

Characterization of a RISC-V System-on-Chip under Neutron Radiation. - Douglas A. dos Santos; Lucas M. Luza; Maria Kastriotou; Carlo Cazzaniga; Cesar A. Zeferino; Douglas R. Melo; Luigi Dilillo (DTIS, 2021)

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip. - Douglas A. dos Santos; André Martins Pio de Mattos; Lucas M. Luza; Carlo Cazzaniga; Maria Kastriotou; Douglas R. Melo; Luigi Dilillo (DFT, 2022)

Evaluation of Xilinx Deep Learning Processing Unit under Neutron Irradiation. - Dimitris Agiakatsikas; Nikos Foutris; Aitzan Sari; Vasileios Vlagkoulis; Ioanna Souvatzoglou; Mihalis Psarakis; Mikel Luján; Maria Kastriotou; Carlo Cazzaniga (CoRR, 2022)

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks. - Lucas Matana Luza; Annachiara Ruospo; Daniel Söderström; Carlo Cazzaniga; Maria Kastriotou; Ernesto Sánchez 001; Alberto Bosio; Luigi Dilillo (IEEE Trans. Emerg. Top. Comput., 2022)

Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation. - Dimitris Agiakatsikas; Nikos Foutris; Aitzan Sari; Vasileios Vlagkoulis; Ioanna Souvatzoglou; Mihalis Psarakis; Ruiqi Ye; John Goodacre; Mikel Luján; Maria Kastriotou; Carlo Cazzaniga; Chris Frost 002 (IEEE Trans. Reliab., 2024)

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments. - Saulo G. Alberton; Alexis C. Vilas Bôas; Jeffery Wyss; Vitor A. P. Aguiar; Matheus S. Pereira; Luca Silvestrin; Serena Mattiazzo; Alessandro Paccagnella; Carlo Cazzaniga; Maria Kastriotou; Christopher D. Frost; Nilberto H. Medina (IEEE Access, 2025)