Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. - Maria Stangoni; Mauro Ciappa; Marco Buzzo; Markus Leicht; Wolfgang Fichtner (Microelectron. Reliab., 2002)

On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. - Giovanna Mura; Massimo Vanzi; Maria Stangoni; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2003)

A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. - Maria Stangoni; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2003)

2D Dopant Profiling on 4H Silicon Carbide P+N Junction by Scanning Capacitance and Scanning Electron Microscopy. - Marco Buzzo; Markus Leicht; Thomas Schweinböck; Mauro Ciappa; Maria Stangoni; Wolfgang Fichtner (Microelectron. Reliab., 2004)

On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques. - Mauro Ciappa; Maria Stangoni; Wolfgang Fichtner; Elisa Ricci 001; Andrea Scorzoni (Microelectron. Reliab., 2004)

Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. - Marco Buzzo; Mauro Ciappa; Maria Stangoni; Wolfgang Fichtner (Microelectron. Reliab., 2005)

Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. - Maria Stangoni; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2005)

Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. - Mauro Ciappa; Luigi Mangiacapra; Maria Stangoni; Stephan Ott; Wolfgang Fichtner (Microelectron. Reliab., 2009)

Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications. - Mauro Ciappa; Luigi Mangiacapra; Maria Stangoni; Stephan Ott; Wolfgang Fichtner (Microelectron. Reliab., 2011)