Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications. - Jacopo Franco; Ben Kaczer; Jérôme Mitard; Maria Toledano-Luque; Felice Crupi; Geert Eneman; Ph. J. Rousse; Tibor Grasser; M. Cho; Thomas Kauerauf; Liesbeth Witters; Geert Hellings; et al. (ICICDT, 2012)

Defect-centric perspective of time-dependent BTI variability. - Maria Toledano-Luque; Ben Kaczer; Jacopo Franco; Philippe Roussel; Tibor Grasser; Guido Groeseneken (Microelectron. Reliab., 2012)

As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability. - Baojun Tang; Kris Croes; Yohan Barbarin; Yunqi Wang; Robin Degraeve; Yunlong Li; Maria Toledano-Luque; Thomas Kauerauf; Jürgen Bömmels; Zsolt Tökei; Ingrid De Wolf (Microelectron. Reliab., 2014)

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. - Baojun Tang; Weidong Zhang 002; Laurent Breuil; Colin Robinson; Yunqi Wang; Maria Toledano-Luque; Geert Van den Bosch; Jianfu Zhang 001; Jan Van Houdt (Microelectron. Reliab., 2014)

Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs. - Alessio Spessot; Romain Ritzenthaler; Tom Schram; Marc Aoulaiche; Moonju Cho; Maria Toledano-Luque; Naoto Horiguchi; Pierre Fazan (ICICDT, 2015)

Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes. - Halil Kükner; Pieter Weckx; Sébastien Morrison; Jacopo Franco; Maria Toledano-Luque; Moonju Cho; Praveen Raghavan; Ben Kaczer; Doyoung Jang; Kenichi Miyaguchi; Marie Garcia Bardon; Francky Catthoor; et al. (Microprocess. Microsystems, 2015)

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. - M. Iqbal Mahmud; Amit Gupta; Maria Toledano-Luque; N. Rao Mavilla; Jeffrey B. Johnson; P. Srinivasan 002; A. Zainuddin; S. Rao; Salvatore Cimino; Byoung Min; Tanya Nigam (IRPS, 2019)

Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. - Maria Toledano-Luque; Peter C. Paliwoda; Mohamed Nour; Thomas Kauerauf; Byoung Min; Germain Bossu; Mahesh Siddabathula; Tanya Nigam (IRPS, 2021)