Regularized regression models to predict the product quality in multistep manufacturing. - Mariam Melhem; Bouchra Ananou; Mustapha Ouladsine; Jacques Pinaton (ICSC, 2016)

Analysis of similarities between alarm events in the semiconductor manufacturing process. - Mariam Melhem; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (MED, 2017)

Product quality prediction using alarm data : Application to the semiconductor manufacturing process. - Mariam Melhem; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (MED, 2017)