Estimating Static Parameters of A-to-D Converters from Spectral Analysis. - Florence Azaïs; Serge Bernard; Yves Bertrand; Mariane Comte; Michel Renovell; Marcelo Lubaszewski (LATW, 2002)

A New Methodology For ADC Test Flow Optimization. - Serge Bernard; Mariane Comte; Florence Azaïs; Yves Bertrand; Michel Renovell (ITC, 2003)

A-to-D converters static error detection from dynamic parameter measurement. - Florence Azaïs; Serge Bernard; Yves Bertrand; Mariane Comte; Michel Renovell (Microelectron. J., 2003)

Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. - Florence Azaïs; Serge Bernard; Yves Bertrand; Mariane Comte; Michel Renovell (J. Electron. Test., 2004)

Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. - Serge Bernard; Mariane Comte; Florence Azaïs; Yves Bertrand; Michel Renovell (J. Electron. Test., 2004)

Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. - Florence Azaïs; Serge Bernard; Yves Bertrand; Mariane Comte; Michel Renovell (J. Electron. Test., 2005)

A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency. - Michel Renovell; Mariane Comte; Ilia Polian; Piet Engelke; Bernd Becker 001 (ATS, 2006)

Electrical Behavior of GOS Fault affected Domino Logic Cell. - Mariane Comte; Satoshi Ohtake; Hideo Fujiwara; Michel Renovell (DELTA, 2006)

A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (IEEE Des. Test Comput., 2006)

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (ETS, 2007)

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (IET Comput. Digit. Tech., 2007)

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. - Alejandro Czutro; Nicolas Houarche; Piet Engelke; Ilia Polian; Mariane Comte; Michel Renovell; Bernd Becker 001 (ETS, 2008)

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Michel Renovell; Mariane Comte; Omar Chakib (VLSI Design, 2008)

A multi-converter DFT technique for complex SIP: Concepts and validation. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (ECCTD, 2009)

An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. - Nicolas Houarche; Mariane Comte; Michel Renovell; Alejandro Czutro; Piet Engelke; Ilia Polian; Bernd Becker 001 (VTS, 2009)

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. - Vincent Kerzerho; Mariane Comte; Florence Azaïs; Philippe Cauvet; Serge Bernard; Michel Renovell (J. Electron. Test., 2011)

Making predictive analog/RF alternate test strategy independent of training set size. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Olivier Potin; Michel Renovell (ITC, 2012)

Smart selection of indirect parameters for DC-based alternate RF IC testing. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Michel Renovell; Vincent Kerzerho; Olivier Potin; Christophe Kelma (VTS, 2012)

MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. - Jie Jiang 018; Marina Aparicio; Mariane Comte; Florence Azaïs; Michel Renovell; Ilia Polian (Asian Test Symposium, 2013)

Implementing model redundancy in predictive alternate test to improve test confidence. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Olivier Potin; Michel Renovell (ETS, 2013)

Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays. - Marina Aparicio; Mariane Comte; Florence Azaïs; Michel Renovell; Jie Jiang 018; Ilia Polian; Bernd Becker 001 (LATW, 2013)

Accurate and efficient analytical electrical model of antenna for NFC applications. - Mouhamadou Dieng; Mariane Comte; Serge Bernard; Vincent Kerzerho; Florence Azaïs; Michel Renovell; Thibault Kervaon; Paul-Henri Pugliesi-Conti (NEWCAS, 2013)

A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. - Vincent Kerzerho; Serge Bernard; Florence Azaïs; Mariane Comte; Olivier Potin; Chuan Shan; G. Bontorin; Michel Renovell (Microelectron. J., 2013)

New implementions of predictive alternate analog/RF test with augmented model redundancy. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Michel Renovell (DATE, 2014)

Solutions for the self-adaptation of communicating systems in operation. - Martin Andraud; Anthony Deluthault; Mouhamadou Dieng; Florence Azaïs; Serge Bernard; Philippe Cauvet; Mariane Comte; Thibault Kervaon; Vincent Kerzerho; Salvador Mir; Paul-Henri Pugliesi-Conti; Michel Renovell; et al. (IOLTS, 2014)

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. - Syhem Larguech; Florence Azaïs; Serge Bernard; Vincent Kerzerho; Mariane Comte; Michel Renovell (LATW, 2014)

Testing for gate oxide short defects using the detectability interval paradigm. - Jean-Marc Gallière; Florence Azaïs; Mariane Comte; Michel Renovell (it Inf. Technol., 2014)

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Michel Renovell (Microelectron. J., 2014)

Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. - Vincent Kerzerho; Ludovic Guillaume-Sage; Florence Azaïs; Mariane Comte; Michel Renovell; Serge Bernard (ISVLSI, 2015)

A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. - Syhem Larguech; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Michel Renovell (ISVLSI, 2015)

Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. - Syhem Larguech; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Michel Renovell (Microelectron. J., 2015)

Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations. - Amit Karel; Mariane Comte; Jean-Marc Gallière; Florence Azaïs; Michel Renovell (ISVLSI, 2016)

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. - Amit Karel; Mariane Comte; Jean-Marc Gallière; Florence Azaïs; Michel Renovell (LATS, 2016)

Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era. - Aida Todri-Sanial; Saraju P. Mohanty; Mariane Comte; Marc Belleville (ACM J. Emerg. Technol. Comput. Syst., 2016)

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. - Amit Karel; Florence Azaïs; Mariane Comte; Jean-Marc Gallière; Michel Renovell; Keshav Singh (ETS, 2017)

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. - Amit Karel; Florence Azaïs; Mariane Comte; Jean-Marc Gallière; Michel Renovell; Keshav Singh (ISVLSI, 2017)

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies. - Amit Karel; Mariane Comte; Jean-Marc Gallière; Florence Azaïs; Michel Renovell (J. Electron. Test., 2017)

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. - Amit Karel; Florence Azaïs; Mariane Comte; Jean-Marc Gallière; Michel Renovell (LATS, 2018)

Use of ensemble methods for indirect test of RF circuits: can it bring benefits? - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (LATS, 2019)

Which metrics to use for RF indirect test strategy? - Hassan El Badawi; Mariane Comte; Florence Azaïs; Vincent Kerzèrho; Serge Bernard; François Lefevre (SMACD, 2019)

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. - Amit Karel; Florence Azaïs; Mariane Comte; Jean-Marc Gallière; Michel Renovell (J. Electron. Test., 2019)

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. - Florence Azaïs; Serge Bernard; Mariane Comte; Bastien Deveautour; Sophie Dupuis; Hassan El Badawi; Marie-Lise Flottes; Patrick Girard 001; Vincent Kerzèrho; Laurent Latorre; François Lefèvre; Bruno Rouzeyre; et al. (IOLTS, 2020)

Implementing indirect test of RF circuits without compromising test quality: a practical case study. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzèrho; Francois Lefevre; I. Gorenflot (LATS, 2020)

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2020)

Exploring on-line RF performance monitoring based on the indirect test strategy. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzèrho; François Lefèvre (LATS, 2021)

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2021)

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2023)

Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology. - Gustavo Aguirre; Freddy Forero; Víctor H. Champac; Michel Renovell; Florence Azaïs; Mariane Comte; Jean-Marc Gallière (IEEE Trans. Very Large Scale Integr. Syst., 2025)