Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors. - Juli Blasco; Helena Castán; Héctor García; Salvador Dueñas; Jordi Suñé; Marianna Kemell; Kaupo Kukli; Mikko Ritala; Markku Leskelä; Enrique Miranda 002 (Microelectron. Reliab., 2014)