Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). - Marianne Diatta; Emilien Bouyssou; David Trémouilles; P. Martinez; F. Roqueta; O. Ory; Marise Bafleur (Microelectron. Reliab., 2009)

New triggering-speed-characterization method for diode-triggered SCR using TLP. - Mouna Mahane; David Trémouilles; Marise Bafleur; Benjamin Thon; Marianne Diatta; Lionel Jaouen (Microelectron. Reliab., 2017)