Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current. - Marine Couret; Gerhard Fischer; Iria Garcia-Lopez; Magali De Matos; François Marc; Cristell Maneux (ESSDERC, 2019)

Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. - Sébastien Fregonese; Chhandak Mukherjee; Holger Rücker; Pascal Chevalier 002; Gerhard Fischer; Didier Céli; Marina Deng; Marine Couret; François Marc; Cristell Maneux; Thomas Zimmer (BCICTS, 2021)

Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. - C. Mukherjee 001; Marine Couret; Cristell Maneux; Didier Céli (ESSDERC, 2021)