Voltage/current measurement performance and power supply rejection in all-digital Class-D power amplifiers. - Mario Mauerer; Arda Tüysüz; Johann W. Kolar (IECON, 2016)

Low-Jitter GaN E-HEMT Gate Driver With High Common-Mode Voltage Transient Immunity. - Mario Mauerer; Arda Tüysüz; Johann W. Kolar (IEEE Trans. Ind. Electron., 2017)