A study on the noise parameters of active devices based on a circuit model approach [HEMTs]. - Alina Caddemi; Mario Sannino (ICECS, 1996)

Determination of HEMT's noise parameters versus temperature using two measurement methods. - Alina Caddemi; Alessandra Di Paola; Mario Sannino (IEEE Trans. Instrum. Meas., 1998)

A novel noise figure and gain test set for microwave devices. - Alessandra Di Paola; Mario Sannino (IEEE Trans. Instrum. Meas., 1999)