A current conveyor based BIC sensor for current monitoring in mixed-signal circuits. - Stelios Siskos; Theodore Laopoulos; Alkiviades A. Hatzopoulos; Marise Bafleur (ICECS, 1996)

The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation. - Christelle Delage; Nicolas Nolhier; Marise Bafleur; Jean-Marie Dorkel; Jo Hamid; Philippe Givelin; Jacques Lin-Kwang (IEEE J. Solid State Circuits, 1999)

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. - Géraldine Bertrand; Christelle Delage; Marise Bafleur; Nicolas Nolhier; Jean-Marie Dorkel; Quang Nguyen; Nicolas Mauran; David Trémouilles; Philippe Perdu (IEEE J. Solid State Circuits, 2001)

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Patrick Poirier; David Trémouilles; Marise Bafleur; Dean Lewis (Microelectron. Reliab., 2001)

In the memory of Georges Charitat. - Marise Bafleur (Microelectron. Reliab., 2002)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. - David Trémouilles; Géraldine Bertrand; Marise Bafleur; Felix Beaudoin; Philippe Perdu; Nicolas Guitard; Lionel Lescouzères (Microelectron. Reliab., 2003)

Determination of the ESD Failure Cause Through its Signature. - M. Zecri; P. Besse; Philippe Givelin; M. Nayrolles; Marise Bafleur; Nicolas Nolhier (Microelectron. Reliab., 2003)

Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency. - David Trémouilles; Marise Bafleur; Géraldine Bertrand; Nicolas Nolhier; Nicolas Mauran; Lionel Lescouzères (IEEE J. Solid State Circuits, 2004)

Study of the ESD defects impact on ICs reliability. - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. - Nicolas Guitard; Fabien Essely; David Trémouilles; Marise Bafleur; Nicolas Nolhier; Philippe Perdu; André Touboul; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2005)

Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's. - C. Lochot; Jean-Philippe Lainé; Marise Bafleur; A. Cazarré; J. Tasselli (Microelectron. J., 2006)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Long-term reliability of silicon bipolar transistors subjected to low constraints. - A. Crosson; Laurent Escotte; Marise Bafleur; D. Talbourdet; L. Crétinon; Philippe Perdu; Guy Perez (Microelectron. Reliab., 2007)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. - Yuan Gao; Nicolas Guitard; Christophe Salamero; Marise Bafleur; Laurent Bary; Laurent Escotte; Patrick Gueulle; Lionel Lescouzères (Microelectron. Reliab., 2007)

Electrostatic discharge failure analysis of capacitive RF MEMS switches. - Jinyu Jason Ruan; Nicolas Nolhier; Marise Bafleur; Laurent Bary; Fabio Coccetti; T. Lisec; Robert Plana (Microelectron. Reliab., 2007)

ESD failure signature in capacitive RF MEMS switches. - Jinyu Jason Ruan; George J. Papaioannou; Nicolas Nolhier; Nicolas Mauran; Marise Bafleur; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2008)

Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). - Marianne Diatta; Emilien Bouyssou; David Trémouilles; P. Martinez; F. Roqueta; O. Ory; Marise Bafleur (Microelectron. Reliab., 2009)

Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm. - J. Bourgeat; Christophe Entringer; Philippe Galy; Marise Bafleur; D. Marin-Cudraz (Microelectron. Reliab., 2010)

MOS-IGBT power devices for high-temperature operation in smart power SOI technology. - Houssam Arbess; Marise Bafleur (Microelectron. Reliab., 2011)

Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs. - Moustafa Zerarka; Patrick Austin; Marise Bafleur (Microelectron. Reliab., 2011)

Energy Harvesting for Powering Wireless Sensor Networks On-Board Geostationary Broadcasting Satellites. - Alexandru Takacs; Hervé Aubert; Marise Bafleur; Jean-Marie Dilhac; F. Courtade; S. Fredon; L. Despoisse; C. Vanhecke; G. Cluzet (GreenCom, 2012)

Towards Energy Autonomy of Wireless Sensors in Aeronautics Applications: SMARTER Collaborative Project. - Marise Bafleur; Jean-Marie Dilhac (GreenCom/iThings/CPScom, 2013)

On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. - Fabrice Caignet; Nicolas Nolhier; Marise Bafleur; A. Wang; Nicolas Mauran (Microelectron. Reliab., 2013)

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. - Nicolas Monnereau; Fabrice Caignet; David Trémouilles; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2013)

Reliability of ESD protection devices designed in a 3D technology. - Bertrand Courivaud; Nicolas Nolhier; Gilles Ferru; Marise Bafleur; Fabrice Caignet (Microelectron. Reliab., 2014)

Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology. - Houssam Arbess; Marise Bafleur; David Trémouilles; Moustafa Zerarka (Microelectron. Reliab., 2015)

Editorial. - Marise Bafleur; Philippe Perdu; François Marc; Hélène Frémont; Nicolas Nolhier (Microelectron. Reliab., 2015)

20 GHz on-chip measurement of ESD waveform for system level analysis. - Fabrice Caignet; Nicolas Nolhier; Marise Bafleur; A. Wang; Nicolas Mauran (Microelectron. Reliab., 2015)

A multifunctional device as both strain sensor and energy harvester for structural health monitoring. - Zheng Jun Chew; Tingwen Ruan; Meiling Zhu; Marise Bafleur; Jean-Marie Dilhac (IEEE SENSORS, 2016)

Impact of non-linear capacitances on transient waveforms during system level ESD stress. - Frédéric Escudié; Fabrice Caignet; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2016)

Prediction of LIN communication robustness against EFT events using dedicated failure models. - Frédéric Escudié; Fabrice Caignet; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2017)

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis. - Nathalie Labat; François Marc; Hélène Frémont; Marise Bafleur (Microelectron. Reliab., 2017)

New triggering-speed-characterization method for diode-triggered SCR using TLP. - Mouna Mahane; David Trémouilles; Marise Bafleur; Benjamin Thon; Marianne Diatta; Lionel Jaouen (Microelectron. Reliab., 2017)

Single Piezoelectric Transducer as Strain Sensor and Energy Harvester Using Time-Multiplexing Operation. - Zheng Jun Chew; Tingwen Ruan; Meiling Zhu; Marise Bafleur; Jean-Marie Dilhac (IEEE Trans. Ind. Electron., 2017)

Energy-harvesting powered variable storage topology for battery-free wireless sensors. - F. El Mahboubi; Marise Bafleur; V. Boitier; Jean-Marie Dilhac (MOCAST, 2018)

A power management system using reconfigurable storage scheme for batteryless wireless sensor nodes. - A. Siskos; F. El Mahboubi; V. Boitier; Theodore Laopoulos; Marise Bafleur (MOCAST, 2018)