High-Level Test Generation Using Symbolic Scheduling. - Mark C. Hansen; John P. Hayes (ITC, 1995)

High-level test generation using physically-induced faults. - Mark C. Hansen; John P. Hayes (VTS, 1995)

Symbolic functional test generation with guaranteed low-level fault detection. - Mark C. Hansen (1996)

Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering. - Mark C. Hansen; Hakan Yalcin; John P. Hayes (IEEE Des. Test Comput., 1999)

Efficient Test Application for Core-Based Systems Using Twisted-Ring Counters. - Anshuman Chandra; Krishnendu Chakrabarty; Mark C. Hansen (VLSI Design, 2001)