An Integrated Approach to Yield Loss Characterization. - Mark Craig; Alvin Jee; Prashant Maniar (ITC, 2002)

A Strategy for Mixed-Signal Yield Improvement. - Jim Bordelon; Ben Tranchina; Vipin Madangarli; Mark Craig (IEEE Des. Test Comput., 2002)

An up-stream design auto-fix flow for manufacturability enhancement. - Jie Yang 010; Ethan Cohen; Cyrus Tabery; Norma Rodriguez; Mark Craig (DAC, 2006)