Verification of analytic point defect models using SUPREM-IV [dopant diffusion]. - Mark E. Law; Robert W. Dutton (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Parameters for point-defect diffusion and recombination. - Mark E. Law (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

Comparison of iterative methods for AC analysis in PISCES-IIB. - Deodatta R. Apte; Mark E. Law (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Automatic grid refinement and higher order flux discretization for diffusion modeling. - Chih-Chuan Lin; Mark E. Law; Rex E. Lowther (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993)

Semiconductor wafer representation for TCAD. - Martin D. Giles; Duane S. Boning; Goodwin R. Chin; Walter C. Dietrich Jr.; Michael S. Karasick; Mark E. Law; Purnendu K. Mozumder; Lee R. Nackman; V. T. Rajan; Duncan M. Hank Walker; Robert H. Wang; Alexander S. Wong (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

An object-oriented approach to device simulation-FLOODS. - Minchang Liang; Mark E. Law (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

Grid adaption near moving boundaries in two dimensions for IC process simulation. - Mark E. Law (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

2-D mesh adaption and flux discretizations for dopant diffusion modeling. - Chih-Chuan Lin; Mark E. Law (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996)

Process modeling for future technologies. - Mark E. Law (IBM J. Res. Dev., 2002)

Perspective on Flipping Circuits I. - Gloria J. Kim; Erin E. Patrick; Ramakant Srivastava; Mark E. Law (IEEE Trans. Educ., 2014)