Early detection and repair of VRT and aging DRAM bits by margined in-field BIST. - Bendik Kleveland; Jeong Choi; Jeff Kumala; Pascal Adam; Patrick Chen; Rajesh Chopra; Antonio Cruz; Ronald B. David; Ashish Dixit; Sinan Doluca; Mark Hendrickson; Ben Lee; et al. (VLSIC, 2014)