A highly efficient robust design under data contamination. - Chanseok Park; Mark Leeds (Comput. Ind. Eng., 2016)

Robust design under normal model departure. - Chanseok Park; Linhan Ouyang; Jai-Hyun Byun; Mark Leeds (Comput. Ind. Eng., 2017)

Improved bootstrap confidence intervals for the process capability index Cpk. - Chanseok Park; Sanku Dey; Linhan Ouyang; Jai-Hyun Byun; Mark Leeds (Commun. Stat. Simul. Comput., 2020)