Degradation dynamics, recovery, and characterization of negative bias temperature instability. - Maxim Ershov; Sharad Saxena; Sean Minehane; P. Clifton; Mark Redford; R. Lindley; H. Karbasi; S. Graves; S. Winters (Microelectron. Reliab., 2005)

DFM: don't care or competitive weapon? - Mark Redford; Joseph Sawicki; Prasad Subramaniam; Cliff Hou; Yervant Zorian; Kimon Michaels (DAC, 2009)

An efficient control variates method for yield estimation of analog circuits based on a local model. - Pierre-Francois Desrumaux; Yoan Dupret; Jens Tingleff; Sean Minehane; Mark Redford; Laurent Latorre; Pascal Nouet (ICCAD, 2012)