A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4. - Juha Häkkinen; Pekka Syri; Juha-Veikko Voutilainen; Markku Moilanen (ITC, 2004)

IEEE 1149.4 Compatible ABMs for Basic RF Measurements. - Pekka Syri; Juha Häkkinen; Markku Moilanen (DATE, 2005)

Methods of Testing Discrete Semiconductors in the 1149.4 Environment. - Jari Hannu; Markku Moilanen (J. Electron. Test., 2007)

Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. - Teuvo Saikkonen; Markku Moilanen (J. Electron. Test., 2007)

A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture. - Juha-Veikko Voutilainen; Jussi Putaala; Markku Moilanen; Heli Jantunen (Microelectron. J., 2009)

Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture. - Jari Hannu; Teuvo Saikkonen; Juha Häkkinen; Juha Karttunen; Markku Moilanen (J. Electron. Test., 2010)

Solder interconnection failure time estimation based on the embedded precursor behaviour modelling. - Juha-Veikko Voutilainen; Juha Häkkinen; Markku Moilanen (Microelectron. Reliab., 2011)

Current State of the Mixed-Signal Test Bus 1149.4. - Jari Hannu; Juha Häkkinen; Juha-Veikko Voutilainen; Heli Jantunen; Markku Moilanen (J. Electron. Test., 2012)