Characterization and simulation methodology for time-dependent variability in advanced technologies. - Pieter Weckx; Ben Kaczer; Praveen Raghavan; Jacopo Franco; Marko Simicic; Philippe J. Roussel; Dimitri Linten; Aaron Thean; Diederik Verkest; Francky Catthoor; Guido Groeseneken (CICC, 2015)

Experimental evidences and simulations of trap generation along a percolation path. - Louis Gerrer; Razaidi Hussin; Salvatore M. Amoroso; Jacopo Franco; Pieter Weckx; Marko Simicic; N. Horiguchi; Ben Kaczer; Tibor Grasser; Asen Asenov (ESSDERC, 2015)

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. - Razaidi Hussin; Louis Gerrer; Jie Ding; Liping Wang; Salvatore M. Amoroso; Binjie Cheng; Dave Reid; Pieter Weckx; Marko Simicic; Jacopo Franco; Annelies Vanderheyden; Danielle Vanhaeren; et al. (ESSDERC, 2015)

Scaling CMOS beyond Si FinFET: an analog/RF perspective. - Bertrand Parvais; Geert Hellings; Marko Simicic; Pieter Weckx; Jérôme Mitard; Doyoung Jang; V. Deshpande; B. van Liempc; Anabela Veloso; A. Vandooren; Niamh Waldron; Piet Wambacq; et al. (ESSDERC, 2018)

ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology. - Marko Simicic; Geert Hellings; Shih-Hung Chen; Naoto Horiguchi; Dimitri Linten (ESSDERC, 2018)

Self-heating-aware CMOS reliability characterization using degradation maps. - Erik Bury; Adrian Vaisman Chasin; Ben Kaczer; Kai-Hsin Chuang; Jacopo Franco; Marko Simicic; Pieter Weckx; Dimitri Linten (IRPS, 2018)

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. - Ben Kaczer; Jacopo Franco; Pieter Weckx; Philippe Roussel; Vamsi Putcha; Erik Bury; Marko Simicic; Adrian Vaisman Chasin; Dimitri Linten; Bertrand Parvais; Francky Catthoor; Gerhard Rzepa; et al. (Microelectron. Reliab., 2018)

Comphy - A compact-physics framework for unified modeling of BTI. - Gerhard Rzepa; Jacopo Franco; Barry J. O'Sullivan; A. Subirats; Marko Simicic; Geert Hellings; Pieter Weckx; Markus Jech; Theresia Knobloch; Michael Waltl; Philippe Roussel; Dimitri Linten; et al. (Microelectron. Reliab., 2018)

CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies. - Shih-Hung Chen; Dimitri Linten; Geert Hellings; Marko Simicic; Ben Kaczer; Thomas Chiarella; Hans Mertens; Jérôme Mitard; Anda Mocuta; N. Horiguchi (IRPS, 2019)

Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP. - Geert Hellings; Philippe Roussel; Nian Wang 004; Roman Boschke; Shih-Hung Chen; Marko Simicic; Mirko Scholz; Soeren Stoedel; Kris Myny; Dimitri Linten; Paul Hellings; Nowab Reza M. D. Ashif (IRPS, 2019)

Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations. - Marko Simicic; Pieter Weckx; Bertrand Parvais; Philippe Roussel; Ben Kaczer; Georges G. E. Gielen (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Degradation mechanisms in Germanium Electro-Absorption Modulators. - Artemisia Tsiara; Alicja Lesniewska; Philippe Roussel; Srinivasan Ashwyn Srinivasan; Mathias Berciano; Marko Simicic; Marianna Pantouvaki; Joris Van Campenhout; Kristof Croes (IRPS, 2022)

Toward 0 V ESD Protection in 2.5D/3D Advanced Bonding Technology. - S.-H. Lin; Marko Simicic; N. Pantano; S.-H. Chen; Geert Van der Plas; Eric Beyne; Piet Wambacq (VLSI Technology and Circuits, 2024)

I/O Circuit and Sub-5V ESD Protection for Advanced Bonding Interfaces. - M. Krilcic; Adrijan Baric; S.-H. Lin; Tomislav Markovic; N. Pantano; Marko Simicic (IRPS, 2025)