Physical modeling of the hysteresis in M0S2 transistors. - Theresia Knobloch; Gerhard Rzepa; Yury Yu. Illarionov; Michael Waltl; Franz Schanovsky; Markus Jech; Bernhard Stampfer; Marco M. Furchi; Thomas Muller; Tibor Grasser (ESSDERC, 2017)

Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence. - Wolfgang Goes; Yannick Wimmer; Al-Moatasem El-Sayed; Gerhard Rzepa; Markus Jech; Alexander L. Shluger; Tibor Grasser (Microelectron. Reliab., 2018)

Comphy - A compact-physics framework for unified modeling of BTI. - Gerhard Rzepa; Jacopo Franco; Barry J. O'Sullivan; A. Subirats; Marko Simicic; Geert Hellings; Pieter Weckx; Markus Jech; Theresia Knobloch; Michael Waltl; Philippe Roussel; Dimitri Linten; et al. (Microelectron. Reliab., 2018)

Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. - Alexander Makarov; Dimitri Linten; Stanislav Tyaginov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Markus Jech; Tibor Grasser (ESSDERC, 2019)

A Compact Physics Analytical Model for Hot-Carrier Degradation. - Stanislav Tyaginov; Alexander Grill; Michiel Vandemaele; Tibor Grasser; Geert Hellings; Alexander Makarov; Markus Jech; Dimitri Linten; Ben Kaczer (IRPS, 2020)

Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface. - Lukas Cvitkovich; Markus Jech; Dominic Waldhör; Al-Moatasem El-Sayed; Christoph Wilhelmer; Tibor Grasser (ESSDERC, 2021)

Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide. - Diego Milardovich; Markus Jech; Dominic Waldhoer; Al-Moatasem Bellah El-Sayed; Tibor Grasser (ESSDERC, 2021)

Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network. - Christoph Wilhelmer; Markus Jech; Dominic Waldhoer; Al-Moatasem Bellah El-Sayed; Lukas Cvitkovich; Tibor Grasser (ESSDERC, 2021)

Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities. - Christoph Wilhelmer; Dominic Waldhoer; Markus Jech; Al-Moatasem Bellah El-Sayed; Lukas Cvitkovich; Michael Waltl; Tibor Grasser (ESSDERC, 2022)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. - Stanislav Tyaginov; Alexander Makarov; Al-Moatasem Bellah El-Sayed; Adrian Vaisman Chasin; Erik Bury; Markus Jech; Michiel Vandemaele; Alexander Grill; An De Keersgieter; Mikhail I. Vexler; Geert Eneman; Ben Kaczer (IRPS, 2022)