A Structural Approach for Space Compaction for Concurrent Checking and BIST. - Markus Seuring; Michael Gössel; Egor S. Sogomonyan (VTS, 1998)

A Structural Approach for Space Compaction for Sequential Circuits. - Markus Seuring; Michael Gössel (DFT, 1999)

Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. - Adit D. Singh; Egor S. Sogomonyan; Michael Gössel; Markus Seuring (ITC, 1999)

A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. - Markus Seuring; Michael Gössel (WIA, 1999)

Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. - Debaleena Das; Nur A. Touba; Markus Seuring; Michael Gössel (IOLTW, 2000)

Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions. - Markus Seuring; Krishnendu Chakrabarty (VTS, 2000)

Output space compaction for testing and concurrent checking. - Markus Seuring (2000)

Space compaction of test responses using orthogonal transmission functions [logic testing]. - Krishnendu Chakrabarty; Markus Seuring (IEEE Trans. Instrum. Meas., 2003)

Multimode scan: Test per clock BIST for IP cores. - Adit D. Singh; Markus Seuring; Michael Gössel; Egor S. Sogomonyan (ACM Trans. Design Autom. Electr. Syst., 2003)

Combining Scan Test and Built-in Self Test. - Markus Seuring (J. Electron. Test., 2006)

Employing the STDF V4-2007 Standard for Scan Test Data Logging. - Markus Seuring; Michael Braun; Alan Ma; Geir Eide; Kathy Yang; Huaxing Tang (IEEE Des. Test, 2012)