Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. - Joachim Würfl; Paul Kurpas; Frank Brunner; Michael Mai; Matthias Rudolph; Markus Weyers (Microelectron. Reliab., 2001)

Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. - Frank Brunner; A. Braun; Paul Kurpas; J. Schneider; Joachim Würfl; Markus Weyers (Microelectron. Reliab., 2003)

Reliability issues of GaN based high voltage power devices. - Joachim Würfl; Eldad Bahat-Treidel; Frank Brunner; E. Cho; Oliver Hilt; Ponky Ivo; A. Knauer; Paul Kurpas; Richard Lossy; Matthias Schulz; S. Singwald; Markus Weyers; et al. (Microelectron. Reliab., 2011)