Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. - Marta Bagatin; Giorgio Cellere; Simone Gerardin; Alessandro Paccagnella; Angelo Visconti; Silvia Beltrami; M. Maccarrone (IOLTS, 2007)

Destructive events in NAND Flash memories irradiated with heavy ions. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Giorgio Cellere; F. Irom; D. N. Nguyen (Microelectron. Reliab., 2010)

Impact of total dose on heavy-ion upsets in floating gate arrays. - Simone Gerardin; Marta Bagatin; Alessandro Paccagnella; G. Cellere; Angelo Visconti; Mauro Bonanomi (Microelectron. Reliab., 2010)

High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. - Cristiana Bolchini; Antonio Miele; Chiara Sandionigi; Marco Ottavi; Salvatore Pontarelli; Adelio Salsano; Cecilia Metra; Martin Omaña 001; Daniele Rossi 001; Matteo Sonza Reorda; Luca Sterpone; Massimo Violante; et al. (DFT, 2012)

Temperature dependence of neutron-induced soft errors in SRAMs. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Carla Andreani; Giuseppe Gorini; Christopher D. Frost (Microelectron. Reliab., 2012)

Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. - Isabella Rossetto; Fabiana Rampazzo; Simone Gerardin; Matteo Meneghini; Marta Bagatin; Alberto Zanandrea; Alessandro Paccagnella; Gaudenzio Meneghesso; Enrico Zanoni; Christian Dua; Marie-Antoinette di Forte-Poisson; Raphael Aubry; et al. (ESSDERC, 2014)

CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. - N. Demaria; G. Dellacasa; G. Mazza; Angelo Rivetti; Manuel D. Da Rocha Rolo; E. Monteil; L. Pacher; Fabio Ciciriello; Francesco Corsi; Cristoforo Marzocca; G. De Roberts; F. Loddo; et al. (IWASI, 2015)

Soft errors in floating gate memory cells: A review. - Marta Bagatin; Simone Gerardin (Microelectron. Reliab., 2015)

Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. - Abhishek Jain 003; Andrea Veggetti 001; Dennis Crippa; Antonio Benfante; Simone Gerardin; Marta Bagatin (IOLTS, 2020)

First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. - Carlo Cazzaniga; Marta Bagatin; Simone Gerardin; Alessandra Costantino; Christopher D. Frost (IEEE Trans. Emerg. Top. Comput., 2021)

Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing. - Abhishek Jain 003; Andrea Mario Veggetti; Dennis Crippa; Antonio Benfante; Simone Gerardin; Marta Bagatin (IEEE J. Solid State Circuits, 2022)