Formal Verification Techniques: Industrial Status and Perspectives. - Joel Blasquez; Marten van Hulst; Andrea Fedeli; Jean-Luc Lambert; Dominique Borrione; Coby Hanoch; Pierre Bricaud (DATE, 2002)

Evaluation of 90nm 6T-SRAM as Physical Unclonable Function for secure key generation in wireless sensor nodes. - Georgios N. Selimis; Mario Konijnenburg; Maryam Ashouei; Jos Huisken; Harmke de Groot; Vincent van der Leest; Geert Jan Schrijen; Marten van Hulst; Pim Tuyls (ISCAS, 2011)