Aging analysis at gate and macro cell level. - Dominik Lorenz; Martin Barke; Ulf Schlichtmann (ICCAD, 2010)

Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling. - Alejandro Masrur; Philipp H. Kindt; Martin Becker 001; Samarjit Chakraborty; Veit Kleeberger; Martin Barke; Ulf Schlichtmann (RTCSA, 2012)

Efficiently analyzing the impact of aging effects on large integrated circuits. - Dominik Lorenz; Martin Barke; Ulf Schlichtmann (Microelectron. Reliab., 2012)

Robustness measurement of integrated circuits and its adaptation to aging effects. - Martin Barke; Michael Kärgel; Markus Olbrich; Ulf Schlichtmann (Microelectron. Reliab., 2014)

A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits. - Veit B. Kleeberger; Martin Barke; Christoph Werner; Doris Schmitt-Landsiedel; Ulf Schlichtmann (Microelectron. Reliab., 2014)

Monitoring of aging in integrated circuits by identifying possible critical paths. - Dominik Lorenz; Martin Barke; Ulf Schlichtmann (Microelectron. Reliab., 2014)

A Cross-Layer Approach to Measure the Robustness of Integrated Circuits. - Martin Barke; Ulf Schlichtmann (ACM J. Emerg. Technol. Comput. Syst., 2015)