Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. - Alberto Castellazzi; V. Kartal; R. Kraus; Norbert Seliger; Martin Honsberg-Riedl; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2003)

Thermal characterisation of power devices during transient operation. - Alberto Castellazzi; Martin Honsberg-Riedl; Gerhard K. M. Wachutka (Microelectron. J., 2006)