Advanced rail clamp networks for ESD protection. - Michael Stockinger; James W. Miller; Michael G. Khazhinsky; Cynthia A. Torres; James C. Weldon; Bryan D. Preble; Martin J. Bayer; Matthew D. Akers; Vishnu G. Kamat (Microelectron. Reliab., 2005)

The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. - Munaf Rahimo; Frank Richter; Fabian Fischer 002; Umamaheswara Vemulapati; Arnost Kopta; Chiara Corvasce; Silvan Geissmann; Marco Bellini; Martin J. Bayer; Friedhelm Bauer (Microelectron. Reliab., 2016)