An interpolation scheme for precision intermediate frequency reflection coefficient measurement. - Maurice G. Cox; Mark P. Dainton; Nick M. Ridler; Martin J. Salter; P. R. Young (IEEE Trans. Instrum. Meas., 2003)

Generalized adaptive calibration schemes for precision RF vector network analyzer measurements. - Andrew G. Morgan; Nick M. Ridler; Martin J. Salter (IEEE Trans. Instrum. Meas., 2003)

RF Measurements for Future Communication Applications: an Overview. - Djamel Allal; R. Bannister; Koen Buisman; Domenico Capriglione; Giulia Di Capua; Martín García-Patrón; Thomas Gatzweiler; Frauke Gellersen; Thomas Harzheim; Holger Heuermann; Johannes Hoffmann; A. Izbrodin; et al. (M&N, 2022)

Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA. - Dilbagh Singh; Martin J. Salter; Susan Johny 001; Nick M. Ridler (IEEE Instrum. Meas. Mag., 2022)

S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10 GHz. - Lewis Manning; Martin J. Salter; Martin Wickham; Ana Robador; Osman Sibonjic; Sani Sarcevic; Semir Cohodarevic; Giovanni Betta; Domenico Capriglione; Gianfranco Miele (M&N, 2024)

Characterisation of Power Transistors for Wireless Network Applications Using Passive and Active Load-Pull. - Dilbagh Singh; Martin J. Salter; Nick M. Ridler (M&N, 2024)

Characterizing S-Parameters of Microwave Coaxial Devices With up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications. - Manoj Stanley; Martin J. Salter; Jonas Urbonas; James Skinner; Sang-Hee Shin; Sebastian De Graaf; Nick M. Ridler (IEEE Trans. Instrum. Meas., 2024)

A Technique to Improve Accuracy of S-Parameter Measurements of Coaxial Connectorized Devices at Cryogenic Temperatures. - Manoj Stanley; Murat Celep; Asem Elarabi; Martin J. Salter; Dilbagh Singh; James Skinner; Sang-Hee Shin; Nick M. Ridler (IEEE Trans. Instrum. Meas., 2025)