A Hybrid Fault Simulator for Synchronous Sequential Circuits. - Rolf Krieger; Bernd Becker 001; Martin Keim (ITC, 1994)

Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy. - Rolf Krieger; Bernd Becker 001; Martin Keim (DAC, 1995)

On the (non-)resetability of synchronous sequential circuits. - Martin Keim; Bernd Becker 001; Birgitta Stenner (VTS, 1996)

Sympathy-MV: Fast Exact Minimization of Fixed Polarity Multi-Valued Linear Expressions. - Rolf Drechsler; Martin Keim; Bernd Becker 001 (ISMVL, 1997)

Fault Simulation in Sequential Multi-Valued Logic Networks. - Rolf Drechsler; Martin Keim; Bernd Becker 001 (ISMVL, 1997)

On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. - Can Ökmen; Martin Keim; Rolf Krieger; Bernd Becker 001 (VTS, 1997)

Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm. - Martin Keim; Nicole Drechsler; Rolf Drechsler; Bernd Becker 001 (ISMVL, 1998)

Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. - Martin Keim; Nicole Drechsler; Bernd Becker 001 (ASP-DAC, 1999)

A scalable BIST architecture for delay faults. - Martin Keim; Ilia Polian; Harry Hengster; Bernd Becker 001 (ETW, 1999)

Hybrid Fault Simulation for Synchronous Sequential Circuits. - Bernd Becker 001; Martin Keim; Rolf Krieger (J. Electron. Test., 1999)

A parameterizable fault simulator for bridging faults. - Piet Engelke; Bernd Becker 001; Martin Keim (ETW, 2000)

Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. - Martin Keim; Nicole Drechsler; Rolf Drechsler; Bernd Becker 001 (J. Electron. Test., 2001)

Sequential n -Detection Criteria: Keep It Simple. - Ilia Polian; Martin Keim; Nicolai Mallig; Bernd Becker 001 (IOLTW, 2002)

Polynomial Formal Verification of Multipliers. - Martin Keim; Rolf Drechsler; Bernd Becker 001; Michael Martin 002; Paul Molitor (Formal Methods Syst. Des., 2003)

Symbolic methods for testing digital circuits. - Martin Keim (2003)

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. - Brady Benware; Cam Lu; John Van Slyke; Prabhu Krishnamurthy; Robert Madge; Martin Keim; Mark Kassab; Janusz Rajski (ITC, 2004)

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. - Martin Keim; Nagesh Tamarapalli; Huaxing Tang; Manish Sharma; Janusz Rajski; Chris Schuermyer; Brady Benware (ITC, 2006)

Scan Diagnosis and Its Successful Industrial Applications. - Wu Yang; Wu-Tung Cheng; Yu Huang 005; Martin Keim; Randy Klingenberg (ATS, 2007)

Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. - Huaxing Tang; Manish Sharma; Janusz Rajski; Martin Keim; Brady Benware (ETS, 2007)

Silicon Evaluation of Static Alternative Fault Models. - Chris Schuermyer; Jewel Pangilinan; Jay Jahangiri; Martin Keim; Janusz Rajski; Brady Benware (VTS, 2007)

Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. - Stefan Hillebrecht; Ilia Polian; Piet Engelke; Bernd Becker 001; Martin Keim; Wu-Tung Cheng (ITC, 2008)

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. - Manish Sharma; Brady Benware; Lei Ling; David Abercrombie; Lincoln Lee; Martin Keim; Huaxing Tang; Wu-Tung Cheng; Ting-Pu Tai; Yi-Jung Chang; Reinhart Lin; Albert Mann (ITC, 2008)

Automatic Test Pattern Generation for Interconnect Open Defects. - Stefan Spinner; Ilia Polian; Piet Engelke; Bernd Becker 001; Martin Keim; Wu-Tung Cheng (VTS, 2008)

Re-using chip level DFT at board level. - Xinli Gu; Jeff Rearick; Bill Eklow; Martin Keim; Jun Qian; Artur Jutman; Krishnendu Chakrabarty; Erik Larsson (ETS, 2012)

Industrial Application of IEEE P1687 for an Automotive Product. - Martin Keim; Tom Waayers; Richard Morren; Friedrich Hapke; Rene Krenz-Baath (DSD, 2013)

Thinking About Adopting IEEE P1687? - Martin Keim (IEEE Des. Test, 2013)

Quo Vadis DFT? - Martin Keim (Aspekte der Technischen Informatik, 2014)

Cell-Aware Test. - Friedrich Hapke; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; Marek Hustava; Martin Keim; Juergen Schloeffel; Anja Fast (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. - Tassanee Payakapan; Senwen Kan; Ken Pham; Kathy Yang; Jean-Francois Cote; Martin Keim; Jennifer Dworak (ITC, 2015)

Adapting an industrial memory BIST solution for testing CAMs. - Jais Abraham; Uttam Garg; Glenn Colón-Bonet; Ramesh Sharma; Chennian Di; Benoit Nadeau-Dostie; Etienne Racine; Martin Keim (ITC-Asia, 2017)

Generalizing Access to Instrumentation Embedded in a Semiconductor Device. - Al Crouch; Michael Laisne; Martin Keim (Computer, 2017)

Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. - Venkat Yellapragada; Suresh Raman; Banadappa Shivaray; Luc Romain; Benoit Nadeau-Dostie; Martin Keim; Jean-Francois Cote; Albert Au; Giri Podichetty; Ashok Anbalan (ITC-Asia, 2018)

Innovative practices on memory test practice. - M. Casarsa; Gurgen Harutyunyan; Kaitlyn Chen; Ramesh Sharma; Giri Podichetty; Martin Keim; Sreejit Chakravarty; Ramesh C. Tekumalla (VTS, 2018)

Linking Chip, Board, and System Test via Standards. - Michele Portolan; Jeff Rearick; Martin Keim (ETS, 2020)

MBIST Support for Reliable eMRAM Sensing. - Jongsin Yun; Benoit Nadeau-Dostie; Martin Keim; Cyrille Dray; El Mehdi Boujamaa (ETS, 2020)

IJTAG Through a Two-Pin Chip Interface. - Manu Baby; Bernd Büttner; Piet Engelke; Ulrike Pfannkuchen; Reinhard Meier; Jonathan Gaudet; Jean-François Côté; Givargis Danialy 001; Martin Keim; Lori Schramm (ITC, 2020)

Modeling Novel Non-JTAG IEEE 1687-Like Architectures. - Mike Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; M. Abdalwahab; Bradford G. Van Treuren; Jeff Rearick (ITC, 2020)

Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces. - Haiying Ma; Ligang Lu; Haitao Qian; Jing Han; Xin Wen; Fanjin Meng; Rahul Singhal; Martin Keim; Yu Huang 005; Wu Yang (ITC, 2020)

MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. - Jongsin Yun; Benoit Nadeau-Dostie; Martin Keim; Lori Schramm; Cyrille Dray; El Mehdi Boujamaa; Khushal Gelda (ITC, 2020)

Convolutional Compaction-Based MRAM Fault Diagnosis. - Bartosz Grzelak; Martin Keim; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ETS, 2021)

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. - Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (ETS, 2021)

Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. - Hans Martin von Staudt; Bradford G. Van Treuren; Jeff Rearick; Michele Portolan; Martin Keim (ETS, 2021)

IEEE P1687.1: Extending the Network Boundaries for Test. - Michael Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; Bradford G. Van Treuren; Jeff Rearick; Songlin Zuo (ITC, 2022)

MBIST-based Trim-Search Test Time Reduction for STT-MRAM. - Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (VTS, 2022)

Affordable and Comprehensive Testing of 3-D Stacked Die Devices. - Jean-François Côté; Jeff Fan; Sean Shen; Givargis Danialy 001; Marcin Lipinski; Michael Garbers; Wu Yang; Martin Keim; Andreas Glowatz; Joe Reynick; Ayush Patel; Joanna Michna (IEEE Des. Test, 2022)

Smart Hammering: A practical method of pinhole detection in MRAM memories. - Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori (DATE, 2023)

Transitioning eMRAM from Pilot Project to Volume Production. - Cyrille Dray; Khushal Gelda; Benoit Nadeau-Dostie; Wei Zou; Luc Romain; Jongsin Yun; Harshitha Kodali; Lori Schramm; Martin Keim (ITC, 2023)

Refreshing the JTAG Family. - Michele Portolan; Martin Keim; Jeff Rearick; Heiko Ehrenberg (VTS, 2023)

New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. - Erik Jan Marinissen; Adrian Evans; Po-Yao Chuang; Martin Keim; Anshuman Chandra (ETS, 2024)

What Would Interactive Testing With 1687 Look Like? - Michele Portolan; Martin Keim; J. F. Coté; Hans-Martin Von Staud (ETS, 2024)

Combining Built-In Redundancy Analysis with ECC for Memory Testing. - Luc Romain; Paul-Patrick Nordmann; Benoit Nadeau-Dostie; Lori Schramm; Martin Keim (ETS, 2024)

MBIST-based weak bit screening method for embedded MRAM. - Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi B. Tahoori; Christopher Münch; Martin Keim (ETS, 2024)

High-Bandwidth IJTAG over SSN. - Jonathan Gaudet; Jan Burchard; Matthias Kampmann; Jean-François Côté; Tim Callahan; Hung Ho Chai; Ivy Ee Hsia Lim; Lori Schramm; Olga Przybysz; Marta Stepniewska; Sascha Ochsenknecht; Michal Olejarz; et al. (ITC, 2024)

Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. - Sandeep Kumar Goel; Ankita Patidar; Moiz Khan; Frank Lee 004; Anshuman Chandra; Martin Keim; Naim Lemar; Jonathan Gaudet; Quoc Phan; Vidya Neerkundar (ITC, 2024)

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. - Jaehoon Lee; Hyeonuk Son; Seohyun Kang; Dahyun Kang; Dongkwan Han; Jongsin Yun; Artur Pogiel; Etienne Racine; Krzysztof Jurga; Lori Schramm; Martin Keim (ITC, 2024)

MBIST-based MRAM defect screening for safety-critical applications. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (ITC, 2024)

Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (VTS, 2024)

IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair. - Erik Jan Marinissen; Vineet Pancholi; Po-Yao Chuang; Martin Keim (VTS, 2024)

Testing Functional Interfaces And Complex PADs Within Multi-Die Packages With IEEE P3405. - Anshuman Chandra; Nir Sever; Martin Keim (ETS, 2025)

DFT Techniques For Efficient 3D IC Interconnect Test For Chiplet and Multi-Die Package. - Anshuman Chandra; Chi-Chun Yang; Quoc Phan; Martin Keim (ETS, 2025)

A Novel BIST Method for Multi-Port Register Files. - Andy Chen; Vianney Choserot; Munish Kumar; Khushal Gelda; Shreyas Pramod Dixit; Wei Zou; Jongsin Yun; Harshitha Kodali; Albert Au; Lori Schramm; Martin Keim (ETS, 2025)

MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori (ETS, 2025)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)

Periodic Non-Destructive Memory BIST for Automotive Applications. - Wei Zou; Artur Pogiel; Albert Au; Martin Keim (VTS, 2025)