High Precision Defect Sizing Method for Capacitive Imaging Based on Physics- Informed Neural Network. - Guojun Fan; Xiaokang Yin 001; Mingrui Zhao; Martin Mwelango; Xin'an Yuan; Wei Li 072 (IEEE Trans. Ind. Informatics, 2025)

Dual-Frequency Electromagnetic Sensor for Nondestructive Evaluation of "Insulator-Conductor" Hybrid Structures. - Mingrui Zhao; Xiaokang Yin 001; Martin Mwelango; Guangqiang Rong; Pengcheng Ma; Jiaxing Huang; Xin'an Yuan; Wei Li 072 (IEEE Trans. Ind. Electron., 2025)