Parametric yield prediction of complex, mixed-signal IC's. - Martin O'Leary; Colin Lyden (IEEE J. Solid State Circuits, 1995)

Guess, solder, measure, repeat: how do I get my mixed-signal chip right? - Geoffrey Ying; Andreas Kuehlmann; Kenneth S. Kundert; Georges G. E. Gielen; Eric Grimme; Martin O'Leary; Sandeep Tare; Warren Wong (DAC, 2009)