Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents. - Klaus-Willi Pieper; Martin Sauter (Microelectron. Reliab., 2001)

Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements. - Martin Sauter (Microelectron. Reliab., 2005)

Simulation and modelling of VDMOSFET self protection under TLP-stress. - Martin Sauter; Joost A. Willemen (Microelectron. Reliab., 2010)

On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). - Martin Sauter; Werner Simbürger; David Johnsson; Matthias Stecher (Microelectron. Reliab., 2011)

Airborne Thermal Data Identifies Groundwater Discharge at the North-Western Coast of the Dead Sea. - Ulf Mallast; Friedhelm Schwonke; Richard Gloaguen; Stefan Geyer; Martin Sauter; Christian Siebert (Remote. Sens., 2013)

A novel modeling approach using arbitrary Lagrangian-Eulerian (ALE) method for the flow simulation in unconfined aquifers. - Yulan Jin; Ekkehard Holzbecher; Martin Sauter (Comput. Geosci., 2014)