Experiments and analysis to characterize logic state retention limitations in 28nm process node. - Sachin Dileep Dasnurkar; Animesh Datta; Mohamed H. Abu-Rahma; Hieu Nguyen; Martin Villafana; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; et al. (VTS, 2013)