Constructing a neural system for surface inspection. - Carl-Henrik Grunditz; Martin Walder; Lambert Spaanenburg (IJCNN, 2004)

Development of a standard for transient measurement of junction-to-case thermal resistance. - Heinz Pape; Dirk Schweitzer; Liu Chen; Rudolf Kutscherauer; Martin Walder (Microelectron. Reliab., 2012)