Prediction of Wafer Map Categories Using Wafer Acceptance Test Parameters in Semiconductor Manufacturing. - Martin Ying Song Lim; Anurag Sharma; Cheng Siong Chin; Chun Ming Tommy Yip; Jonathan Yoong Seang Ong (AIAI (2), 2022)

Wafer Region Yield Prediction: Employing Majority Under-Sampling and Output Binarization on Low-Yield Threshold. - Martin Ying Song Lim; Anurag Sharma; Cheng Siong Chin (IEEE Access, 2025)