CCD adaptive filtering for robust LPC speech processing. - Gerald M. Borsuk; Marvin H. White (ICASSP, 1979)

Charge-Coupled Device (CCD) Adaptive Discrete Analog Signal Processing. - Marvin H. White; Ingham A. Mack; Gerald M. Borsuk; Donald R. Lampe; Francis J. Kub (IEEE Trans. Commun., 1979)

Carrier Recovery Techniques Using Synchronous Oscillators. - Vasil Uzunoglu; Marvin H. White (ICC, 1986)

Some important properties of synchronous oscillators. - Vasil Uzunoglu; Marvin H. White (Proc. IEEE, 1986)

Simulation of biological ion channels with technology computer-aided design. - Santosh Pandey; Akwete Bortei-Doku; Marvin H. White (Comput. Methods Programs Biomed., 2007)

A preliminary study of the Coherent Phase Synchronous Oscillator (CPSO) for Phase-Locked Loop (PLL) applications. - Feiran Lei; Marvin H. White (MWSCAS, 2013)

A low noise, inductor-less, integer-N RF synthesizer using phase-locked loop with reference injection (PLL-RI). - Feiran Lei; Marvin H. White (MWSCAS, 2017)

Reference Injected Phase-Locked Loops (PLL-RIs). - Feiran Lei; Marvin H. White (IEEE Trans. Circuits Syst. I Regul. Pap., 2017)

Design Strategies for Rugged SiC Power Devices. - Diang Xing; Tianshi Liu; Susanna Yu; Minseok Kang; Arash Salemi; Marvin H. White; Anant K. Agarwal (IRPS, 2019)

Gate Oxide Reliability Studies of Commercial 1.2 kV 4H-SiC Power MOSFETs. - Tianshi Liu; Shengnan Zhu; Susanna Yu; Diang Xing; Arash Salemi; Minseok Kang; Kristen Booth; Marvin H. White; Anant K. Agarwal (IRPS, 2020)

Threshold Voltage Instability of Commercial 1.2 kV SiC Power MOSFETs. - Susanna Yu; Tianshi Liu; Shengnan Zhu; Diang Xing; Arash Salemi; Minseok Kang; Kristen Booth; Marvin H. White; Anant K. Agarwal (IRPS, 2020)

Investigation of Gate Leakage Current Behavior for Commercial 1.2 kV 4H-SiC Power MOSFETs. - Shengnan Zhu; Tianshi Liu; Marvin H. White; Anant K. Agarwal; Arash Salemi; David Sheridan (IRPS, 2021)

SPICE Modeling and CMOS Circuit Development of a SiC Power IC Technology. - Tianshi Liu; Hua Zhang; Sundar Babu Isukapati; Emaran Ashik; Adam J. Morgan; Bongmook Lee; Woongje Sung; Marvin H. White; Ayman A. Fayed; Anant K. Agarwal (MWSCAS, 2021)

Experimental Determination of Interface Trap Density and Fixed Positive Oxide Charge in Commercial 4H-SiC Power MOSFETs. - Susanna Yu; Marvin H. White; Anant K. Agarwal (IEEE Access, 2021)

Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs. - Limeng Shi; Shengnan Zhu; Jiashu Qian; Michael Jin; Monikuntala Bhattacharya; Marvin H. White; Anant K. Agarwal; Atsushi Shimbori; Tianshi Liu (IRPS, 2023)

Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs. - Shengnan Zhu; Limeng Shi; Michael Jin; Jiashu Qian; Monikuntala Bhattacharya; Hema Lata Rao Maddi; Marvin H. White; Anant K. Agarwal; Tianshi Liu; Atsushi Shimbori; Chingchi Chen (IRPS, 2023)

Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress. - Jiashu Qian; Limeng Shi; Michael Jin; Monikuntala Bhattacharya; Hengyu Yu; Marvin H. White; Anant K. Agarwal; Atsushi Shimbori; Tianshi Liu; Shengnan Zhu (IRPS, 2024)

Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs. - Limeng Shi; Jiashu Qian; Michael Jin; Monikuntala Bhattacharya; Hengyu Yu; Marvin H. White; Anant K. Agarwal; Atsushi Shimbori (IRPS, 2024)