Magnetoresistance measurements and unusual mobilitiy behavior in FD MOSFETs. - Sung-Jae Chang; Sorin Cristoloveanu; Maryline Bawedin; Jong-Hyun Lee; Jung-Hee Lee; Sutirtha Mukhopadhyay; Benjamin A. Piot (ESSDERC, 2013)

Why are SCE overestimated in FD-SOI MOSFETs? - Carlos Navarro; Maryline Bawedin; François Andrieu; Bruno Sagnes; Sorin Cristoloveanu (ESSDERC, 2013)

Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects. - Sung-Jae Chang; Maryline Bawedin; Wade Xiong; Jong-Hyun Lee; Jung-Hee Lee; Sorin Cristoloveanu (Microelectron. Reliab., 2013)

CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes. - Carlos Navarro; Maryline Bawedin; François Andrieu; Jacques Cluzel; Xavier Garros; Sorin Cristoloveanu (ESSDERC, 2014)

Mobility spectrum analysis of magnetoresistance in fully-depleted MOSFETs. - Gilberto Antonio Umana-Membreno; Sung-Jae Chang; Maryline Bawedin; Jaroslav Antoszewski; Sorin Cristoloveanu; Lorenzo Faraone (ESSDERC, 2014)

Back-gate effects and detailed characterization of junctionless transistor. - Mukta Singh Parihar; Fanyu Liu; Carlos Navarro; Sylvain Barraud; Maryline Bawedin; Irina Ionica; Abhinav Kranti; Sorin Cristoloveanu (ESSDERC, 2015)

FDSOI devices: Issues and innovative solutions. - Sorin Cristoloveanu; Maryline Bawedin (ESSDERC, 2016)

Carrier lifetime evaluation in FD-SOI layers. - Kyung Hwa Lee; Maryline Bawedin; Hyungjin Park; Mukta Singh Parihar; Sorin Cristoloveanu (ESSDERC, 2017)

Sharp switching, hysteresis-free characteristics of Z2-FET for fast logic applications. - Kyunghwa Lee; Hassan El Dirani; Pascal Fonteneau; Maryline Bawedin; Shingo Sato; Sorin Cristoloveanu (ESSDERC, 2018)

Optimized in situ heating control on a new MOS device structure in 28nm UTBB FD-SOI CMOS technology. - Philippe Galy; R. Lethiecq; Maryline Bawedin (ICICDT, 2018)

1T1C Ultra low power relative Thermal-Voltage sensor in 28nm UTBB FD-SOI CMOS technology for standard, spatial and quantum applications. - Philippe Galy; R. Lethiecq; Maryline Bawedin (ICICDT, 2019)

Compact MOS Structure & Design for Ion-Ioff Thermal control in 28nm UTBB FD-SOI CMOS technology. - R. Lethiecq; Maryline Bawedin; Philippe Galy (ICICDT, 2019)