An integrated timing and dynamic supply noise verification for nano-meter CMOS SoC designs. - Kenji Shimazaki; Mitsuya Fukazawa; Makoto Nagata; Shingo Miyahara; Masaaki Hirata; Kazuhiro Satoh; Hiroyuki Tsujikawa (CICC, 2005)

An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs. - Kenji Shimazaki; Makoto Nagata; Mitsuya Fukazawa; Shingo Miyahara; Masaaki Hirata; Kazuhiro Satoh; Hiroyuki Tsujikawa (IEICE Trans. Electron., 2006)