Reliability analysis of InGaN Blu-Ray laser diode. - Nicola Trivellin; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda (Microelectron. Reliab., 2009)

Reliability evaluation for Blu-Ray laser diodes. - Matteo Meneghini; Nicola Trivellin; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2010)

An Advanced 405-nm Laser Diode Crystallization Method of a-Si Film for Fabricating Microcrystalline-Si TFTs. - Kiyoshi Morimoto; Nobuyasu Suzuki; Kazuhiko Yamanaka; Masaaki Yuri; Janet Milliez; Xinbing Liu (IEICE Trans. Electron., 2011)