Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor (HD-GIT) under practical switching operations. - Ayanori Ikoshi; Masahiro Toki; Hiroto Yamagiwa; Daijiro Arisawa; Masahiro Hikita; Kazuki Suzuki; Manabu Yanagihara; Yasuhiro Uemoto; Kenichiro Tanaka; Tetsuzo Ueda (IRPS, 2018)

Influence of Donor-Type Hole Traps Under P-GaN Gate in GaN-Based Gate Injection Transistor (GIT). - Kenichiro Tanaka; Masahiro Hikita; Tetsuzo Ueda (IRPS, 2019)