A High-Speed IDDQ Sensor for Low-Voltage ICs. - Masaki Hashizume; Yukiya Miura; Masahiro Ichimiya; Takeomi Tamesada; Kozo Kinoshita (Asian Test Symposium, 1998)

High speed IDDQ test and its testability for process variation. - Masaki Hashizume; Hiroyuki Yotsuyanagi; Masahiro Ichimiya; Takeomi Tamesada; Masashi Takeda (Asian Test Symposium, 2000)

CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. - Masaki Hashizume; Masahiro Ichimiya; Hiroyuki Yotsuyanagi; Takeomi Tamesada (Asian Test Symposium, 2001)

IDDQ Sensing Technique for High Speed IDDQ Testing. - Teppei Takeda; Masaki Hashizume; Masahiro Ichimiya; Hiroyuki Yotsuyanagi; Yukiya Miura; Kozo Kinoshita (Asian Test Symposium, 2001)

CMOS open defect detection by supply current test. - Masaki Hashizume; Masahiro Ichimiya; Hiroyuki Yotsuyanagi; Takeomi Tamesada (DATE, 2001)

Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. - Hiroyuki Yotsuyanagi; Masaki Hashizume; Taisuke Iwakiri; Masahiro Ichimiya; Takeomi Tamesada (DFT, 2001)

Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. - Hiroyuki Yotsuyanagi; Masaki Hashizume; Taisuke Iwakiri; Masahiro Ichimiya; Takeomi Tamesada (DELTA, 2002)

A test circuit for pin shorts generating oscillation in CMOS logic circuits. - Masahiro Ichimiya; Masaki Hashizume; Hiroyuki Yotsuyanagi; Takeomi Tamesada (Syst. Comput. Jpn., 2004)

Electric field for detecting open leads in CMOS logic circuits by supply current testing. - Masaki Hashizume; Masahiro Ichimiya; Hiroyuki Yotsuyanagi; Takeomi Tamesada (ISCAS (3), 2005)