Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection. - Koji Nakamae; Masaki Chikahisa; Hiromu Fujioka (Image Vis. Comput., 2007)

Experiences with software product line engineering in product development oriented organization. - Yasuaki Takebe; Naohiko Fukaya; Masaki Chikahisa; Toshihide Hanawa; Osamu Shirai (SPLC, 2009)

A Rule-based Automated Approach for Extracting Models from Source Code. - Makoto Ichii; Tomoyuki Myojin; Yuichiroh Nakagawa; Masaki Chikahisa; Hideto Ogawa (WCRE, 2012)

A Model-Checking Approach for Fault Analysis Based on Configurable Model Extraction. - Hideto Ogawa; Makoto Ichii; Tomoyuki Myojin; Masaki Chikahisa; Yuichiroh Nakagawa (IEICE Trans. Inf. Syst., 2015)