Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. - Shigeru Nakahara; Keiichi Higeta; Masaki Kohno; Toshiaki Kawamura; Keizo Kakitani (ITC, 1999)

An evaluation of defect-oriented test: WELL-controlled low voltage test. - Yasuo Sato; Masaki Kohno; Toshio Ikeda; Iwao Yamazaki; Masato Hamamoto (ITC, 2001)