Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise. - Kan Takeuchi; Masaki Shimada; Takao Sato; Yusaku Katsuki; Hiroumi Yoshikawa; Hiroaki Matsushita (IEEE Trans. Very Large Scale Integr. Syst., 2013)

FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (ESSCIRC, 2016)

Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (IET Circuits Devices Syst., 2018)

Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. - Kan Takeuchi; Masaki Shimada; Shinya Konishi; Daisuke Oshida; Naoya Ota; Takashi Yasumasu; Koji Shibutani; Tomohiro Iwashita; Tetsuya Kokubun; Fumio Tsuchiya (IRPS, 2019)

Evaluation of the Effect of Transfer Learning to Multi-Instance Detection of Monkeys. - Riza Rae Pineda; Takatomi Kubo; Masaki Shimada; Kazushi Ikeda (APSIPA ASC, 2021)

Deep MAnTra: deep learning-based multi-animal tracking for Japanese macaques. - Riza Rae Pineda; Takatomi Kubo; Masaki Shimada; Kazushi Ikeda (Artif. Life Robotics, 2023)