Simple noise model and low-noise data-output buffer for ultrahigh-speed memories. - Tomohisa Wada; Masanao Eino; Kenji Anami (IEEE J. Solid State Circuits, 1990)

Variable bit organization as a new test function for standard memories. - Tomohisa Wada; Masanao Eino; Motomu Ukita; Kenji Anami (IEEE J. Solid State Circuits, 1991)